This paper investigates the immunity and effect of a low-noise amplifier (LNA) using a transient voltage suppressor (TVS) diode for electro-static discharge (ESD) protection. The introduced off-chip ESD device, in our example a TVS diode, increases the power to failure of the LNA, but also results in mismatch in terms of S-parameters and noise figure. It is especially obvious when frequencies rise higher. To overcome this side effect, the filter can be constructed, providing standard Chebyshev filter matching for the LNA. This methodology is useful for further discussion regarding semiconductor protection under ESD pulses.