Field-circuit coupled simulation of core grounding current of a VSC transformer
编号:572 访问权限:仅限参会人 更新:2022-08-29 16:19:33 浏览:156次 张贴报告

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摘要
Purpose/Aim
The structure and operating conditions of VSC transformer are different from those of power transformer and converter transformer. Compute the grounding current of the core and clamp accurately is helpful to evaluate the operation status of transformer.
Experimental/Modeling methods
A method for computing the earthing current of a transformer is proposed. Firstly, a geometric model is established to characterize each metal structure in the transformer. Secondly, a finite element model of electrostatic field is established and the partial capacitance matrix is calculated. The circuit simulation model of the transformer can be obtained from the partial capacitance matrix, by which the grounding current can be computed.
Results/discussion
The VSC transformer core ground shield is grounded through the clamp, so the clamp grounding current is greater than the core. The computed grounding currents of the core and clamp are 18 and 274mA respectively, which are basically close to the measured results of 18 and 258mA.
Conclusions
The grounding current of transformer core and clamp is mainly capacitive current. With a larger size of core and higher the voltage of inner winding, grounding current is greater.
 
关键词
transformer,Electric field,circuit
报告人
kejie huang
Electric Power Research Institute; China southern power grid

稿件作者
kejie huang Electric Power Research Institute; China southern power grid
Jianwei Cheng Electric Power Research Institute; China Southern Power Grid
Shuaibing Wang Electric Power Research Institute; China southern power grid
Lianwei Bao Electric Power Research Institute, CSG
Yuan La Ltd;China Southern Power Grid Co.
Yutong Zhang Xi’an Jiaotong University
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重要日期
  • 会议日期

    09月25日

    2022

    09月29日

    2022

  • 08月15日 2022

    提前注册日期

  • 09月10日 2022

    报告提交截止日期

  • 11月10日 2022

    注册截止日期

  • 11月30日 2022

    初稿截稿日期

  • 11月30日 2022

    终稿截稿日期

主办单位
IEEE DEIS
承办单位
Chongqing University
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