摘要详情
4 / 2024-03-13 21:55:24
MSD-YOLO：A Novel Method for Detecting Microscopic Surface Defects in Industrial Products
Defect detection,Computer vision,YOLO,Small object detection,Metal spray painting surface defects
全文待审
Metal spray-painted thermal mugs are industrially manufactured products massively produced worldwide. The quality of the surface paint of the metal spray-painted thermal mugs is crucial for enhancing customer satisfaction and reducing product return rates. A novel surface defect target detection network named MSD-YOLO was proposed in this paper. It is based on the YOLO object detection framework, combined with advanced multi-scale feature fusion modules and lightweight convolutional modules, so as to detect microscopic defects while controlling computational costs. Specifically, the sensitivity to microscopic defect features is increased by adding advanced multi-scale feature fusion module. Experiments showed that MSD-YOLO had excellent sensitivity to microscopic defects and real-time performance. Compared with the original YOLO, the index of F1@0.5 and mAP@0.5 of MDSD-YOLO in micro defect target detection increased by 6.8% and 11.6% respectively. It is not only more suitable for detecting microscopic defects, but also easy to deploy in industrial control detection equipment with limited computing power. Furthermore, this study also contributes a dataset of surface defects on metal spray-painted thermal mugs, which enriches the data in the field of surface defects of industrial products.
重要日期
-
会议日期
06月14日
2024
至06月16日
2024
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06月16日 2024
注册截止日期
主办单位
IEEE Computational Intelligence Society
IEEE Instrumentation and Measurement Society
IEEE Instrumentation and Measurement Society
联系方式
历届会议
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2022年06月15日 德国 Chemnitz
2022 IEEE 9th International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications -
2021年06月18日
2021 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications -
2019年06月14日 中国
2019 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications -
2018年06月12日 加拿大
2018 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications -
2016年06月27日 匈牙利 Budapest,Hungary
2016 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications
