Development status and prospects of high repetition rate XFEL detectors
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更新:2024-04-23 00:25:15 浏览:101次
张贴报告
摘要
With the construction and use of a series of advanced X-ray light sources such as synchrotron radiation and free electron laser (XFEL) devices, especially the construction of high repetition rate XFEL devices, higher requirements have been put forward for X-ray detectors. Due to the characteristics of high spatial resolution, low noise, and radiation imaging of pixel array detectors, as well as the ability of modern chip manufacturing technology to achieve highly integrated pixelated ASICs, the bottleneck problem in the development of large array pixel array detectors has been solved. Therefore, pixel array array detectors have gradually become a research hotspot in the field of X-ray detectors and an indispensable detection equipment in the construction of XFEL devices. This paper introduces the basic principles and implementation methods of high repetition rate XFEL detectors in response to the requirements of high repetition rate XFEL detectors. The development status of high repetition rate XFEL array detectors at home and abroad is elaborated, and the basic scheme for implementing high repetition rate detectors is proposed. The future development direction is also discussed.
关键词
X-ray free electron laser,Pixel ASIC,Array detector,synchrotron radiation
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