Development status and prospects of high repetition rate XFEL detectors
编号:126 访问权限:仅限参会人 更新:2024-04-23 00:25:15 浏览:101次 张贴报告

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摘要
      With the construction and use of a series of advanced X-ray light sources such as synchrotron radiation and free electron laser (XFEL) devices, especially the construction of high repetition rate XFEL devices, higher requirements have been put forward for X-ray detectors. Due to the characteristics of high spatial resolution, low noise, and radiation imaging of pixel array detectors, as well as the ability of modern chip manufacturing technology to achieve highly integrated pixelated ASICs, the bottleneck problem in the development of large array pixel array detectors has been solved. Therefore, pixel array array detectors have gradually become a research hotspot in the field of X-ray detectors and an indispensable detection equipment in the construction of XFEL devices. This paper introduces the basic principles and implementation methods of high repetition rate XFEL detectors in response to the requirements of high repetition rate XFEL detectors. The development status of high repetition rate XFEL array detectors at home and abroad is elaborated, and the basic scheme for implementing high repetition rate detectors is proposed. The future development direction is also discussed.
关键词
X-ray free electron laser,Pixel ASIC,Array detector,synchrotron radiation
报告人
Weixin Qian
中物院流体物理研究所

稿件作者
Weixin Qian 中物院流体物理研究所
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    05月13日

    2024

    05月17日

    2024

  • 03月31日 2024

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  • 04月15日 2024

    摘要截稿日期

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冲击波物理与爆轰物理全国重点实验室
浙江大学物理学院
中国核学会脉冲功率技术及其应用分会
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