XFEL leads a temporal and spatial diagnostic capability, with its ultra-high photon flux, ultra-short pulse-width and strong coherence. However, these characteristics can also cause a damage of the diagnostic samples. Especially in high-repetition-rate XFEL experiments, the damage will affect the diagnostic results of next XFEL pulse. Therefore, the balance between damage and signal-to-noise ratio would affect the efficiency of high-repetition-rate XFEL experiments. Here we built a XFEL-materials interactions code called XMI for simulating the damage process and diffraction diagnostic process. Moreover, we found the photon energy of XFEL would be the key parameter.
 

High repetition frequency XFEL,XFEL-materials damage