153 / 2024-08-31 19:23:01
SpikingVPR: Spiking Neural Network-Based Feature Aggregation for Visual Place Recognition
Visual place recognition,Spiking Neural Network,Feature Aggregation,Event-Driven Mechanism
终稿
QieshiZhang / CAS Key Laboratory of Human-Machine Intelligence-Synergy Systems,Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, China
GulinWang / CAS Key Laboratory of Human-Machine Intelligence-Synergy Systems,Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, China
ZiliangRen / Dongguan University of Technology
ChengJun / CAS Key Laboratory of Human-Machine Intelligence-Synergy Systems,Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, China
Visual Place Recognition (VPR) is a crucial task in robotics and autonomous driving, where it identifies the geographic location of a query image by matching it with a reference database. VPR faces significant challenges, including appearance variations due to lighting, occlusion, weather, and seasonal changes, alongside the need for real-time processing under low computational cost and latency. To address these challenges, we introduce Spiking Neural Networks (SNN) into the VPR task, specifically focusing on the feature aggregation component. SNNs, with their event-driven nature, offer advantages in computational efficiency and energy consumption, making them well-suited for energy-constrained environments such as drones. Our approach transforms the feature aggregation stage of VPR into a spiking, event-driven mechanism, which maintains high recall performance while integrating seamlessly with traditional ANN-based methods. Experimental results demonstrate that our SNN-based method effectively maintains high recall performance, validating its potential in autonomous driving and other related applications.
重要日期
  • 会议日期

    10月31日

    2024

    11月03日

    2024

  • 09月30日 2024

    初稿截稿日期

  • 11月12日 2024

    注册截止日期

主办单位
Anhui University
Xi’an Jiaotong University
Harbin Institute of Technology
IEEE Instrumentation & Measurement Society
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