摘要详情

ID / 提交时间

206 / 2024-09-02 09:16:23

标题

Investigation on the Valance Band Structure of HOPG Using Ultraviolet Photoelectron Spectroscopy System

关键字

Ultraviolet Photoelectron Spectroscopy, HOPG, Electronic Structure

主题及专题

Special Sessions > SS06 Principles, methods and applications of photoelectron spectroscopy analytical instruments

状态

终稿

作者

HouXiaohan / Xi'an Jiaotong University

InoueSeiun / Chiba University

GuoYali / Xi’an Jiaotong University

TongBohao / Xi’an Jiaotong University

HisaoIshii / Chiba University

ChenYu / Xi'an Jiaotong University

摘要

This paper provides a basic introduction to the principles of ultraviolet photoelectron spectroscopy (UPS), ultraviolet photoelectron yield spectroscopy (PYS), and constant final state yield spectroscopy (CFS-YS) measurements. Different measurements were performed on HOPG, obtaining a series of electronic energy level parameters such as work functionΦ= 4.56 eV, valance band energy E_VBM= 0.87 eV, and ionization energy I_th= 5.35 eV. It offers an initial understanding of the surface electronic structure via the ultraviolet photoelectron spectroscopy. The electronic structure of the material surface can be more finely characterized through the comparison and joint analysis of different measurement methods.