Design of Vehicle Bus Signal Simulation Device
编号:10 访问权限:仅限参会人 更新:2024-10-23 11:38:38 浏览:150次 张贴报告

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摘要
As the functions of automobiles continue to increase and become more intelligent, the data exchange and communication between onboard electronic devices have become increasingly important. To ensure the reliability and stability of these systems in practical applications, it is necessary to manually simulate the testing and verification of ECUs with erroneous bus data packets. This paper designs a vehicular bus signal simulation device that can simulate the generation of CAN, LIN, FlexRay, CXPI, and SENT bus signals and their fault data packets. The hardware part of the device consists of an arbitrary waveform generator and an upper computer, while the software part uses QT to design the user interface and C++ to write the programmable software. Finally, experiments have verified the performance and accuracy of the simulation device. The waveforms captured by the digital storage oscilloscope are consistent with the expected input parameters, proving the effectiveness of the device. This device has significant application value in the development, teaching, and training of automotive electronic systems, capable of reducing the reliance on real-vehicle testing, and reducing test costs and time
关键词
Vehicle bus, Signal Simulation, QT
报告人
QiaoJiaqing
Harbin Institute of Technology;School of Electronics and Information Engineering

稿件作者
ChenSirui School of Electronics and Information Engineering Harbin Institute of Technology
WangShiji Beijing Aerospace Measurement and Control Technology Co., Ltd
ChenWenke Beijing Aerospace Measurement and Control Technology Co., Ltd
LiBaohua School of Electronics and Information Engineering Harbin Institute of Technology
QiaoJiaqing Harbin Institute of Technology;School of Electronics and Information Engineering
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重要日期
  • 会议日期

    10月31日

    2024

    11月03日

    2024

  • 09月30日 2024

    初稿截稿日期

  • 11月12日 2024

    注册截止日期

主办单位
Anhui University
Xi’an Jiaotong University
Harbin Institute of Technology
IEEE Instrumentation & Measurement Society
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