Investigation on the Valance Band Structure of HOPG Using Ultraviolet Photoelectron Spectroscopy System
编号:100 访问权限:仅限参会人 更新:2024-10-23 10:28:30 浏览:185次 口头报告

报告开始:2024年11月02日 10:30(Asia/Shanghai)

报告时间:20min

所在会场:[P3] Parallel Session 3 [P3-2] Parallel Session 3(November 2 AM)

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摘要
This paper provides a basic introduction to the principles and instrumentation of ultraviolet photoelectron spectroscopy (UPS), ultraviolet photoelectron yield spectroscopy (PYS), and constant final state- yield spectroscopy (CFS-YS) measurements. It’s performed different measurements of HOPG and compared the results, deciding a series of electronic energy level parameters such as work functionΦ= 4.56 eV, valance band energy EVBM= 0.87 eV, and ionization energy Ith= 5.35 eV. It offers an initial understanding of the surface electronic structure via ultraviolet photoelectron spectroscopy method. It’s also demonstrated that ultraviolet photoelectron spectroscopy is an effective method for characterizing the electronic structure of materials.
 
关键词
Ultraviolet Photoelectron Spectroscopy, HOPG, Electronic Structure
报告人
HouXiaohan
None Xi'an Jiaotong University

稿件作者
HouXiaohan Xi'an Jiaotong University
InoueSeiun Chiba University
GuoYali Xi’an Jiaotong University
TongBohao Xi’an Jiaotong University
HisaoIshii Chiba University
ChenYu Xi'an Jiaotong University
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重要日期
  • 会议日期

    10月31日

    2024

    11月03日

    2024

  • 09月30日 2024

    初稿截稿日期

  • 11月12日 2024

    注册截止日期

主办单位
Anhui University
Xi’an Jiaotong University
Harbin Institute of Technology
IEEE Instrumentation & Measurement Society
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