Design and application of high fidelity sampling algorithm for flight test data
编号:161 访问权限:仅限参会人 更新:2024-10-23 10:02:36 浏览:166次 张贴报告

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摘要
Flight test data is a critical element for characterizing aircraft performance and status, serving essential roles throughout stages such as design, manufacturing, flight testing, and operations. Generated by onboard data acquisition systems as strict time-series data, flight test data is utilized by engineers and data analysts for computation, analysis, and visualization to assess flight mission outcomes. Traditional client-server (C/S) architecture for data visualization involves reading all data points throughout the entire process and using graphics cards for sampling display. However, as the number of flight test data parameters grows exponentially and data volumes increase, data management applications have adopted distributed storage architectures. Consequently, data analysis and visualization have primarily shifted to browser-server (B/S) architecture modes. A single flight test parameter for one mission can generate tens of millions of data points, often requiring simultaneous display of multiple parameters. Due to browser performance limitations, reading all data points in real-time is impractical. Therefore, a high-fidelity sampling algorithm must be developed, tailored to the specific characteristics of flight test data. This algorithm should extract key feature points, adapt to display resolution, and ensure high-fidelity visualization of flight test data, meeting the demands of B/S architecture analysis applications.
 
关键词
Flight Test Data; High-Fidelity; Sampling Algorithm; Data Analysis; Visualization Display
报告人
DengGuobao
Senior Engineer Flight Test Center of COMAC

稿件作者
LiuTao 中国商飞民用飞机试飞中心
FengCan 中国商飞民用飞机试飞中心
ZhaXiaowen 中国商飞民用飞机试飞中心
DengGuobao Flight Test Center of COMAC
XueBowen 中国商飞民用飞机试飞中心
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重要日期
  • 会议日期

    10月31日

    2024

    11月03日

    2024

  • 09月30日 2024

    初稿截稿日期

  • 11月12日 2024

    注册截止日期

主办单位
Anhui University
Xi’an Jiaotong University
Harbin Institute of Technology
IEEE Instrumentation & Measurement Society
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