报告详情
Capacitor array bonding defect detection based on active infrared thermography
编号：75
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更新：2024-10-23 11:25:44
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口头报告
报告开始：2024年11月01日 14:40（Asia/Shanghai）
报告时间：20min
所在会场：[P5] Parallel Session 5 [P5-1] Parallel Session 5（November 1 PM）
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摘要
Active frequency selective surface (AFSS) is composed of the traditional frequency selective surface (FSS) unit patterns and a series of impedance elements loaded between them, performing excellent adjustable electromagnetic characteristics. The quality of solder joints seriously affects the frequency response characteristics of AFSS, while a series of inspection methods such as manual visual inspection unable to meet the increasingly stringent inspection standards. Searching for efficient and accurate means of detecting soldering defects has become the focus of attention of many researchers. Taking AFSS based on array capacitor as an example, a solder joint defect detection method based on active infrared thermal imaging and improved YOLOv3 is proposed. The active infrared detection system for solder joint defects is built, and the thermal infrared image data set of capacitor solder joint defects is established through data enhancement. Aiming at the feature that the defects in the data set are concentrated on small scales, the feature loss is reduced by introducing the SPDConv module in the backbone network, and the improved CBAM attention module is introduced in the residual module to focus on the small target features. At the same time, the RFB-Conv module is built for replacing the CBL stacked blocks in the original neck structure of YOLOv3, which helps to homogenize the delicate sensory field. The experimental results show that the method has excellent performance in the detection of AFSS solder joint defects based on array capacitors, which provides a good idea for the detection of AFSS.
关键词
defect detection; target detection; YOLOv3; feature fusion; AFSS
报告人
HuangYifan
Student Huazhong University of Science and Technology稿件作者
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重要日期
-
会议日期
10月31日
2024
至11月03日
2024
-
09月30日 2024
初稿截稿日期
-
11月12日 2024
注册截止日期
主办单位
Anhui University
Xi’an Jiaotong University
Harbin Institute of Technology
IEEE Instrumentation & Measurement Society
Xi’an Jiaotong University
Harbin Institute of Technology
IEEE Instrumentation & Measurement Society
联系方式
- Mrs. icsmd
- ic******@163.com
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