Shock-Resistant Design for MEMS Optical Switch Based on Displacement-Limited Structure
编号:76 访问权限:仅限参会人 更新:2024-10-23 10:39:26 浏览:198次 口头报告

报告开始:2024年11月01日 14:40(Asia/Shanghai)

报告时间:20min

所在会场:[P2] Parallel Session 2 [P2-1] Parallel Session 2(November 1 PM)

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摘要
For microelectromechanical system (MEMS) optical switch integrating various functions, increasing the shock resistance is important for increasing their range of applications. In this study, a MEMS optical switch was designed with high shock resistance based on displacement-limited structures. A back-support structure and glass cap work together to protect the movable microstructure against out-of-plane displacement. A double-sided deep reactive ion etching process was used to fabricate the MEMS optical switch on a silicon-on-insulator substrate. A model was constructed based on displacement-limited dynamics to explain the protection mechanism under high overloads. Experimental results indicated that the MEMS optical switch survived overloads as high as 25,000 g with an impulse of 105 µs, which far surpass the shock resistances of existing designs. This study is expected to promote the application of functional MEMS optical switch in high shocking environments
关键词
displacement-limited structures, light weight design, microelectromechanical system, optical switch, shock-resistant
报告人
ZhaoYizhuang
Student Beijing Institute of Technology

稿件作者
XieJin China Academy of Engineering Physics
HeTao Beijing Institute of Technology
LianZheng Beijing Institute of Technology
ZhangXiao China Academy of Engineering Physics
XiongZhuang China Academy of Engineering Physics
CaoJun Beijing Institute of Technology
ZhangHao Beijing University of Technology
ZengChao China Academy of Engineering Physics
ZhaoYizhuang Beijing Institute of Technology
DaiJun Beijing Institute of Technology
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重要日期
  • 会议日期

    10月31日

    2024

    11月03日

    2024

  • 09月30日 2024

    初稿截稿日期

  • 11月12日 2024

    注册截止日期

主办单位
Anhui University
Xi’an Jiaotong University
Harbin Institute of Technology
IEEE Instrumentation & Measurement Society
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