Integrated Scratch Marker for Wafer Defect Diagnosis
2021 IEEE International Test Conference in Asia
Li Katherine Shu-Min National Sun Yat-Sen University
SS /SS4
2021年08月20日 21:25~21:45
仅限参会人 口头报告
Dynamic characteristics analysis of gear bearing system considering the fractal rough tooth surface wear
19th Asia-Pacific Vibration Conference
Xu Jinchi Northeastern University
暂无会场信息
仅限参会人 张贴报告
Dynamic response of a friction sealed rotor system considering bearing time varying stiffness under maneuvering flight
19th Asia-Pacific Vibration Conference
Chen Renzhen Northeastern University
暂无会场信息
仅限参会人 张贴报告
Identification of Counter Registers through Full Scan Chain
2021 IEEE International Test Conference in Asia
Wang Qidong Harbin Institute of Technology, Shenzhen
SS /SS2
2021年08月19日 22:50~23:10
公开 口头报告
Rigorous Test Flow for PLL to Identify Weak Devices
2021 IEEE International Test Conference in Asia
Huang Shi-Yu National Tsing Hua University
SS /SS4
2021年08月20日 21:45~22:05
仅限参会人 口头报告
Automatic Test Program Generation for Transition Delay Faults in Pipelined Processors
2021 IEEE International Test Conference in Asia
Huang Jiun-Lang ,National Taiwan University
RS /RS2
2021年08月19日 21:25~21:45
仅限参会人 口头报告
The ANN Based Modeling Attack and Security Enhancement of the Double-layer PUF
2021 IEEE International Test Conference in Asia
Chen Yongliang Peking University Shenzhen Graduate School
RS /RS1
2021年08月19日 20:20~20:40
仅限参会人 口头报告
Parallel DICE Cells and Dual-Level CEs based 3-Node-Upset Tolerant Latch Design for Highly Robust Computing
2021 IEEE International Test Conference in Asia
Yan Aibin Anhui University
RS /RS3
2021年08月20日 11:30~11:50
公开 口头报告
Developing Formal Models for Measuring Fault Effects Using Functional EDA Tools
2021 IEEE International Test Conference in Asia
Wu Lingjuan ,huazhong agricultural university
RS /RS2
2021年08月19日 21:05~21:25
公开 口头报告
