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活动简介

Development of standardized measurement methods, reference materials, and metrology ensure the accuracy and reliability of test results, quality consistency of manufacturing, and support all aspects of nanoscience research, R&D, and commercialization. This sub-conference provides a forum to discuss the scientific challenges, roadmap, and opportunities associated with these efforts.

征稿信息

重要日期

2017-06-01
摘要截稿日期

征稿范围

Sub-conference topics include but not limited to:

  • Traceable measurements and instrumentation;

  • uncertainty assessment associated with nanoscale measurements;

  • reference material;

  • nanotechnology standardization;

  • nanometrology.

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重要日期
  • 会议日期

    08月29日

    2017

    08月31日

    2017

  • 06月01日 2017

    摘要截稿日期

  • 08月31日 2017

    注册截止日期

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