Development of standardized measurement methods, reference materials, and metrology ensure the accuracy and reliability of test results, quality consistency of manufacturing, and support all aspects of nanoscience research, R&D, and commercialization. This sub-conference provides a forum to discuss the scientific challenges, roadmap, and opportunities associated with these efforts.
Sub-conference topics include but not limited to:
Traceable measurements and instrumentation;
uncertainty assessment associated with nanoscale measurements;
reference material;
nanotechnology standardization;
nanometrology.
08月29日
2017
08月31日
2017
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