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活动简介
The challenge of managing Reliability in a dynamic global market is increasing. ASTR 2013 will provide a forum to exchange knowledge and share ideas that address industry endeavors to limit field failures of products and to revisit existing qualification procedures. The focus will be on improving strategies to screen defects and weaknesses in electronic, electro-mechanical, and structural systems while reconciling high product Quality and Reliability with low product development cost and time to market. The program will feature industry leading keynote speakers and selected presentations.
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Topics Re-Thinking and Re-Visiting Qualification Spec ASTR in Energy Efficient Hardware/Systems Accelerated Testing & Field Failures COTS Components in military hardware/systems Failure Analysis (FA) & Prognostics and Health Management Predictive
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重要日期
  • 会议日期

    10月09日

    2013

    10月11日

    2013

  • 10月11日 2013

    注册截止日期

主办单位
IEEE Components, Packaging and Manufacturing Technology Society
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