Papers are solicited on, but not limited to, the following topics:

• reflection, scattering and diffraction theory, modeling and analysis
• advances in measurement methods, techniques and optical instrumentation
• coherent effects, including surface plasmons, localization, speckle and speckle correlations, and spectral shifts
• rough surface retrieval
• polarization analysis and measurement for scattering and diffraction
• scatterometry, reflectometry, and spectroscopic ellipsometry
• bidirectional reflectance, transmittance and scatter distribution functions (BRDF, BTDF, and BSDF, respectively)
• sources of scatter, including surface properties, particulate contamination, molecular contamination, and on-orbit effects
• scattering models and measurements for computer graphics and machine vision
• scattering computation for non conventional imagery (polarization imagery, 3D laser imagery)
• light scattering methods and instruments for medical diagnosis including tissue optics
• multispectral scatter from pharmaceutical and biomedical materials
• surface roughness measurement with stylus and optical profilometry, STM, AFM, and near-field optical microscopes
• software for stray light analysis
• novel techniques for stray light analysis and suppression in imaging and illumination systems
• metrology standards and uncertainty evaluation
• stray light issues in novel optical systems involving elements such as diffractive optics, segmented and sparse aperture optics, hyperspectral imaging, etc.
• system level stray light analysis and comparison to test and deployed results
• signature analysis and processing of laser-radar and seeker data
• Rayleigh scattering, velocimetry, transient grating spectroscopy, holography
• micro/nano applications and optical systems.