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活动简介

This symposium will focus on presenting the latest scientific and engineering breakthroughs to develop cutting edge measurement technologies and intelligent instruments. The symposium will also offer precious opportunities for experts of the field together with research students to discuss many state-of-art techniques on the diverse topics of measurement science and technology. During the symposium, exhibition and industrial forum will be organized to show measurement instruments of the latest technologies by many famous manufacturers worldwide.

征稿信息

重要日期

2017-03-15
摘要截稿日期
2017-03-31
摘要录用日期
2017-05-01
初稿截稿日期

征稿范围

  • Micro and Nano Metrology

  • In-Process and Online Metrology

  • Management of Measurement Processes

  • Optical Metrology

  • Surface Metrology

  • Machine Vision and Image Processing

  • Intelligent Instruments for Automation

  • Sensors and Actuators

  • Calibration and Machine Tool Performance

  • Material Characterization

  • Education and Training in Metrology

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重要日期
  • 会议日期

    09月22日

    2017

    09月25日

    2017

  • 03月15日 2017

    摘要截稿日期

  • 03月31日 2017

    摘要录用通知日期

  • 05月01日 2017

    初稿截稿日期

  • 09月25日 2017

    注册截止日期

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