The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. The 22nd NATW will feature a half day tutorial on Wednesday titled “VLSI Test and Security.” The program includes a keynote by Brian Gaucher (IBM) on Smart Power Grids and an invited address by Stephen Sunter (Mentor Graphics) on Analog/Mixed-signal Test. In addition to traditional topics, the 22nd NATW will feature a general theme of “Growing importance of Test and Hardware Security.”