The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. Topics are not limited to, but can include the following: Analog, Mixed Signal & RF Testing Board Level Testing Delay & Performance Testing Design Verification/Validation Diagnosis and Debug DFM, Defect Analysis & Defect-Based Testing Memory & MEMS Testing Online Testing System-on-Chip (SoC) Test & Debug FPGA & Embedded Core Testing Fault Modeling/Simulation Test Quality/System Reliability Testing for Soft Errors/Defects Nanotechnology Testing IDDQ Testing